Deskripsi produk

SmartSPM Scanner and Base

Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Sample size: Maximum 40 x 50 mm, 15 mm thickness

Sample positioning: Motorized sample positioning range 5 x 5 mm

Positioning resolution: 1 µm

AFM Head HE002

Laser wavelength: 1300nm;

No registration laser influence on biological sample;

No registration laser influence on photovoltaic measurements;

Registration system noise: <0.1nm;

Fully motorized: 4 stepper motors for cantilever and photodiode automated alignment;

Free access to the probe for additional external manipulators and probes;

Top and side simultaneous optical access: with planapochromat objectives, Side objective up to 100x, NA=0.7 Top objective 10x, NA=0.28 simultaneously;

SPM Measuring Modes

Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional).

Measuring SPM Modes simultaneously with Raman measurements

Contact AFM in air;

Contact AFM in liquid (optional);

Semicontact AFM in air;

Semicontact AFM in liquid (optional);

Dynamic Force Microscopy (DFM, FM-AFM);

Dissipation Force Microscopy;

True Non-contact AFM;

Phase Imaging;

Lateral Force Microscopy (LFM);

Force Modulation;

Conductive AFM (optional);

Single-pass Kelvin Probe;

Piezo Response Force Microscopy (PFM);

STM (optional);

Photocurrent Mapping (optional);

Shear-force Microscopy with tuning fork (ShFM) (optional);

Normal Force Microscopy with tuning fork (optional).

Spectroscopy Modes

Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy

Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes

Tip-EnhancedPhotoluminescence (TEPL)

Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM).

Conductive AFM Unit (optional)

Current range:  100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software.

Optical Access

Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously.

Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 20 µm x 20 µm x 15 µm; Resolution: 1 nm  

‘
‘
‘
Hubungi:
PT Bopana Arga Prima Jaya
Jalan Jupiter VI Perum Bintang Metropol
Blok A7 No.16 Bekasi Utara 17122
Jawa Barat, Indonesia
Telp : 021-22163350
Hp : 08119762505 / 081285345374
Email : boney@bapj.co.id / tesa@bapj.co.id